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5 March 2019 Ultrafast nanoscale dynamics probed by time-resolved transmission electron microscopy (Conference Presentation)
Sascha Schäfer
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Proceedings Volume 10916, Ultrafast Phenomena and Nanophotonics XXIII; 109160Q (2019) https://doi.org/10.1117/12.2509381
Event: SPIE OPTO, 2019, San Francisco, California, United States
Abstract
Ultrafast transmission electron microscopy (UTEM) is a promising experimental approach for the investigation of ultrafast dynamics on nanometer length scales [1]. In UTEM, optically triggered dynamics are imaged by femtosecond electron pulses, utilizing the versatile imaging and diffraction capabilities of state-of-the-art transmission electron microscopy. In the Göttingen UTEM project, we developed nanoscale laser-driven photocathodes, delivering ultrashort high-coherence electron pulses. With this approach, we achieve, at the sample position, electron focal spot sizes down to below one nanometer and pulse durations of about 200 fs [2], which now enables the detailed real-space investigation of fast processes in nanostructured systems. In this contribution, first applications of the Göttingen UTEM instrument are presented, including the coherent phase modulation of electron pulses in optical near-fields [3] and its use for the formation of attosecond electron pulse trains [4], the nanoscale mapping of optically induced ultrafast structural dynamics [5], and our current progress towards ultrafast magnetic imaging using phase sensitive imaging [6]. [1] A. H. Zewail, Science 328, 187–93 (2010). [2] A. Feist et al., Ultramicroscopy 176, 63-73 (2017). [3] A. Feist et al., Nature 521, 200–203 (2015). [4] K. E. Priebe et al., Nature Photonics 11, 793 (2017). [5] A. Feist et al., Structural Dynamics 5, 014302 (2018). [6] N. Rubiano da Silva et al., Phys. Rev X, accepted (2018).
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Sascha Schäfer "Ultrafast nanoscale dynamics probed by time-resolved transmission electron microscopy (Conference Presentation)", Proc. SPIE 10916, Ultrafast Phenomena and Nanophotonics XXIII, 109160Q (5 March 2019); https://doi.org/10.1117/12.2509381
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KEYWORDS
Transmission electron microscopy
Ultrafast imaging
Near field optics
Ultrafast phenomena
Laser development
Structural dynamics
Diffraction
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