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Time-resolved fluorescence imaging (TR-FLIM) allows to obtain time-resolved photoluminescence maps with a micrometric resolution. We showed last year that wide-field illumination with TR-FLIM allows to observe lateral transport to a more defective zone. This study will be focused on point and structured illumination, extending the breadth of this characterization technique to bare & homogeneous absorbers. We explore this new possibility by presenting applications for a wide range of semi-conductors. By treating the datacubes with algorithms solving 2D/3D drift-diffusion equations, we derive optoelectronic properties representative for lateral diffusion and local recombination properties.
Adrien Bercegol,Daniel Ory, andLaurent Lombez
"Time-resolved imaging of lateral charge carrier transport in photovoltaic absorbers (Conference Presentation)", Proc. SPIE 10913, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices VIII, 1091303 (8 March 2019); https://doi.org/10.1117/12.2511716
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Adrien Bercegol, Daniel Ory, Laurent Lombez, "Time-resolved imaging of lateral charge carrier transport in photovoltaic absorbers (Conference Presentation)," Proc. SPIE 10913, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices VIII, 1091303 (8 March 2019); https://doi.org/10.1117/12.2511716