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31 August 2018 Detection v-defect in 20° wedge by laser ultrasound technique
Jing Jia, Xueping Jing, Qingbang Han
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Proceedings Volume 10835, Global Intelligence Industry Conference (GIIC 2018); 108350G (2018) https://doi.org/10.1117/12.2504321
Event: Global Intelligent Industry Conference 2018, 2018, Beijing, China
Abstract
The research focuses on measuring the influence of V-defect on wedge waves propagating along line wedge tip by using laser ultrasound technique. Generally, wedge has more or less defect or damage on the tip, which may result in break and bring economic losses. Thus it is necessary to investigate characteristic of wedge waves propagating along line wedge with defect. The wedge waveguide models with different defect depth were built by using finite element method. Multiple mode wedge waves were observed through B-scan. The open of defect is 0.1mm, and the depth is 0.01mm, 0.05mm, 0.1mm, 0.2mm, and 0.3mm, respectively. It was seen that both reflected and transmitted waves were observed. Due to the dispersion characteristics, we observed the reflected and transmitted A1 mode separated from A2 mode, which can be used to determine the width of V-defect. Meanwhile, models of V-defect with different depth are also built. We had found that wedge waves are totally reflected and there is no transmitted wave observed as the depth is bigger than 0.3mm.
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Jing Jia, Xueping Jing, and Qingbang Han "Detection v-defect in 20° wedge by laser ultrasound technique", Proc. SPIE 10835, Global Intelligence Industry Conference (GIIC 2018), 108350G (31 August 2018); https://doi.org/10.1117/12.2504321
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KEYWORDS
Wave propagation
Finite element methods
Acoustics
Waveguides
Dispersion
Pulsed laser operation
Waveguide modes
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