David I. Serrano-García,1 Humberto Macías-Mendoza,1 Jorge L. Flores,1 Guillermo García-Toraleshttps://orcid.org/0000-0002-3556-6480,1 Gelizlte A. Parra-Escamilla,1 Antonio Muñoz2
1Univ. of Guadalajara (Mexico) 2Univ. de Guadalajara (Mexico)
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We present a polarization sensitive measurement focused on retrieve elliptical phase retardation properties. The system is based on rotating two linear polarizers. And a demodulation algorithm is proposed to retrieve a partial matrix of Muller from the intensity output signal. The polarimetry setup also employs a monochrome camera as detection system and a HeNe laser as light source. Simulation and experimental results in transparent samples are presented showing the feasibility of the measurement and the potential usage in a multiwavelength arrangement.
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David I. Serrano-García, Humberto Macías-Mendoza, Jorge L. Flores, Guillermo García-Torales, Gelizlte A. Parra-Escamilla, Antonio Muñoz, "Retardance polarization measurement based on a dual rotating polarizer arrangement," Proc. SPIE 10765, Infrared Remote Sensing and Instrumentation XXVI, 107650N (18 September 2018); https://doi.org/10.1117/12.2321676