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18 September 2018 Co25Fe75 thin films with ultralow total damping (Conference Presentation)
Eric Edwards, Hans Nembach, Justin Shaw
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Proceedings Volume 10732, Spintronics XI; 1073205 (2018) https://doi.org/10.1117/12.2322157
Event: SPIE Nanoscience + Engineering, 2018, San Diego, California, United States
Abstract
We experimentally investigate the dynamic properties of Co25Fe75 thin films grown by dc magnetron sputtering. Using ferromagnetic resonance spectroscopy, we demonstrate an ultralow total damping parameter in the out-of-plane configuration of < 0.0013, whereas for the in-plane configuration we find a minimum total damping of < 0.0020. In both cases, we observe low inhomogeneous linewidth broadening in macroscopic films. We observe a minimum full-width half-maximum linewidth of 1 mT at 10 GHz resonance frequency for a 12nm thick film. We characterize the morphology and structure of these films as a function of seed layer combinations and find large variation of the qualitative behavior of the in-plane linewidth vs. resonance frequency. Finally, we use wavevector-dependent Brillouin light scattering spectroscopy to characterize the linewidth of spin-wave modes and their group velocity at wave vectors up to 23 µm-1.
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Eric Edwards, Hans Nembach, and Justin Shaw "Co25Fe75 thin films with ultralow total damping (Conference Presentation)", Proc. SPIE 10732, Spintronics XI, 1073205 (18 September 2018); https://doi.org/10.1117/12.2322157
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KEYWORDS
Thin films
Spectroscopy
Ferromagnetics
Light scattering
Sputter deposition
Thin film growth
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