Optically quantum-well-pumped semiconductor disk lasers for single- and dual-wavelength emission

Markus Polanik; Philipp Ackermann; Alexander Hein; Peter Unger

doi:10.1117/12.2306431

9 May 2018 Optically quantum-well-pumped semiconductor disk lasers for single- and dual-wavelength emission

Markus Polanik, Philipp Ackermann, Alexander Hein, Peter Unger

Proceedings Volume 10682, Semiconductor Lasers and Laser Dynamics VIII; 1068214 (2018) https://doi.org/10.1117/12.2306431
Event: SPIE Photonics Europe, 2018, Strasbourg, France

Abstract

We present a design and output characteristics of an optically quantum-well-pumped semiconductor laser for single- and dual-wavelength emission which has a resonant disk structure for two wavelengths that lie 36.7nm apart. The smaller resonance wavelength is intended for the pump wavelength of 940 nm. Laser emission, however, can either take place at the short and/or at the long resonance wavelength. A switch between the emission wavelengths is performed by moving the gain peak towards the desired wavelength. For instance, while the heat-sink of the laser is kept at -15°C the laser will only emit a wavelength of 957.0 nm, a change of the heat-sink temperature to 50°C does result in an emission at the other resonance wavelength located at 997.5 nm. In both cases slope efficiencies above 50% and output powers beyond 10W are possible. Limiting factor is the available pump power. A simultaneous emission at 960.8 and 997.5nm is observed for heat-sink temperatures between 21.3 and 27.1°C. The intra-cavity performed sum-frequency generation (SFG) of the dual-wavelength laser leads to an emission at 489.7 nm.

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Markus Polanik, Philipp Ackermann, Alexander Hein, and Peter Unger "Optically quantum-well-pumped semiconductor disk lasers for single- and dual-wavelength emission", Proc. SPIE 10682, Semiconductor Lasers and Laser Dynamics VIII, 1068214 (9 May 2018); https://doi.org/10.1117/12.2306431

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KEYWORDS

Disk lasers

Semiconducting wafers

Semiconductor lasers

Absorption

Temperature metrology

Semiconductors

Reflectivity

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