Paper
1 December 2017 Thermal stability of gallium arsenide solar cells
Nikola Papež, Ľubomír Škvarenina, Pavel Tofel, Dinara Sobola
Author Affiliations +
Proceedings Volume 10603, Photonics, Devices, and Systems VII; 1060313 (2017) https://doi.org/10.1117/12.2292673
Event: Photonics Prague 2017, 2017, Prague, Czech Republic
Abstract
This article summarizes a measurement of gallium arsenide (GaAs) solar cells during their thermal processing. These solar cells compared to standard silicon cells have better efficiency and high thermal stability. However, their use is partly limited due to high acquisition costs. For these reasons, GaAs cells are deployed only in the most demanding applications where their features are needed, such as space applications. In this work, GaAs solar cells were studied in a high temperature range within 30-650 °C where their functionality and changes in surface topology were monitored. These changes were recorded using an electron microscope which determined the position of the defects; using an atomic force microscope we determined the roughness of the surface and an infrared camera that showed us the thermal radiated places of the defected parts of the cell. The electrical characteristics of the cells during processing were determined by its current-voltage characteristics. Despite the occurrence of subtle changes on the solar cell with newly created surface features after 300 °C thermal processing, its current-voltage characteristic remained without a significant change.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nikola Papež, Ľubomír Škvarenina, Pavel Tofel, and Dinara Sobola "Thermal stability of gallium arsenide solar cells", Proc. SPIE 10603, Photonics, Devices, and Systems VII, 1060313 (1 December 2017); https://doi.org/10.1117/12.2292673
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Solar cells

Gallium arsenide

Scanning electron microscopy

Image processing

Temperature metrology

Atomic force microscopy

Infrared cameras

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