Paper
19 June 2017 Smart mapping for quick detection of dissimilar binary images
Author Affiliations +
Proceedings Volume 10443, Second International Workshop on Pattern Recognition; 104430U (2017) https://doi.org/10.1117/12.2280291
Event: Second International Workshop on Pattern Recognition, 2017, Singapore, Singapore
Abstract
In previous work, a probabilistic image matching model for binary images was developed that predicts the number of mappings required to detect dissimilarity between any pair of binary images based on the amount of similarity between them. The model showed that dissimilarity can be detected quickly by randomly comparing corresponding points between two binary images. In this paper, we improve on this quickness for images that have dissimilarity concentrated near their centers. We apply smart mapping schemes to different image sets and analyze the results to show the effectiveness of this mapping scheme for images that have dissimilarity concentrated near their center. We compare three different smart mapping schemes with three different mapping densities to find the best mapping / best density performance.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Adnan A. Y. Mustafa "Smart mapping for quick detection of dissimilar binary images", Proc. SPIE 10443, Second International Workshop on Pattern Recognition, 104430U (19 June 2017); https://doi.org/10.1117/12.2280291
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Binary data

Visual process modeling

Image analysis

Robot vision

Computer vision technology

Image registration

Image retrieval

RELATED CONTENT

Space And Time Requirements For Two Image Data Structures
Proceedings of SPIE (March 27 1989)
Timed fast exact Euclidean distance (tFEED) maps
Proceedings of SPIE (February 25 2005)
Graphical Operations In A Hierarchical Parallel Computer
Proceedings of SPIE (January 17 1985)
Vision System That Learns How To Inspect Parts
Proceedings of SPIE (November 22 1982)
Knowledge-based system for analysis of aerial images
Proceedings of SPIE (February 01 1991)

Back to Top