Surface parameter based image estimation from application of a scattering model to polarized light measurements

Hanyu Zhan; Hanwan Jiang; David G. Voelz; Meredith K. Kupinski

doi:10.1117/12.2274972

30 August 2017 Surface parameter based image estimation from application of a scattering model to polarized light measurements

Hanyu Zhan, Hanwan Jiang, David G. Voelz, Meredith K. Kupinski

Author Affiliations +

Proceedings Volume 10407, Polarization Science and Remote Sensing VIII; 104070U (2017) https://doi.org/10.1117/12.2274972
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

An important task for remote sensing applications is the characterization of material properties, which can be accomplished by estimating physics-based parameters from optical scattering off a target’s surface. In this paper, a novel approach is described to generate parameter-based images by applying the modified polarimetric bidirectional reflectance distribution function (pBRDF) model to the polarimetric imaging measurements collected with the University of Arizona’s Ground Multiangle SpectroPolarimetric Imager (Ground-MSPI). Values for complex refractive index (η), slope variance roughness (σ²) and diffuse scattering coefficient (ρ_d) for each pixel are jointly estimated. Images consisting of the parameter values are generated by using the estimation results and optimized by contrast-ratio enhancement algorithms. The approach offers significant potential for remote targets analysis and novel imaging technology development.

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Hanyu Zhan, Hanwan Jiang, David G. Voelz, and Meredith K. Kupinski "Surface parameter based image estimation from application of a scattering model to polarized light measurements", Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 104070U (30 August 2017); https://doi.org/10.1117/12.2274972

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