One shot profile measurements using a binary-encoded pattern

Wei-Hung Su; Sih-Yue Chen

doi:10.1117/12.2275322

23 August 2017 One shot profile measurements using a binary-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI; 103820T (2017) https://doi.org/10.1117/12.2275322
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

A one-shot profilometry for surfaces with color or reflectivity discontinuties is presented. It uses binary-encoded pattern to illuminate the inspected object and a monochromatic camera to observe the deformed fringes at another view angle. The encoded pattern provides additional to identify the fringe order. For spatially isolated objects or surfaces with large depth discontinuities, unwrapping can be identified without ambiguity. Even though the surface color or reflectivity varies rapidly with position, it distinguishes the fringe order as well.

Conference Presentation

Citation Download Citation

Wei-Hung Su and Sih-Yue Chen "One shot profile measurements using a binary-encoded pattern", Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820T (23 August 2017); https://doi.org/10.1117/12.2275322

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