Overview of CMOS technology for radiometry and passive imaging

Adrian Tang

doi:10.1117/12.2260920

18 May 2017 Overview of CMOS technology for radiometry and passive imaging

Adrian Tang

Proceedings Volume 10194, Micro- and Nanotechnology Sensors, Systems, and Applications IX; 101942P (2017) https://doi.org/10.1117/12.2260920
Event: SPIE Defense + Security, 2017, Anaheim, CA, United States

Abstract

This paper discusses the effects of gain drift and variation often referred to as “ΔG/G” in CMOS mm-wave radiometers as well as the techniques employed to suppress its effects on radiometric and passive imaging instruments. The paper presents a demonstration of a CMOS Dicke-switched radiometer which uses correlated double sampling to eliminate gain variation, and investigates the contributions of the ΔG/G behavior to the demonstrated instrument’s measured NEΔT through experimental approaches. Finally the paper describes how the discrepancies between calculation and measurement can be attributed to limited performance of Dicke switches in silicon and how further development is needed to truly hit useful NEΔT resolutions in the 1°K range.

Conference Presentation

Citation Download Citation

Adrian Tang "Overview of CMOS technology for radiometry and passive imaging", Proc. SPIE 10194, Micro- and Nanotechnology Sensors, Systems, and Applications IX, 101942P (18 May 2017); https://doi.org/10.1117/12.2260920

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