Characterizing transverse thermoelectrics:  Novel techniques for anisotropic ambipolar semiconductors (Conference Presentation)

Matthew Grayson

doi:10.1117/12.2266121

7 June 2017 Characterizing transverse thermoelectrics: Novel techniques for anisotropic ambipolar semiconductors (Conference Presentation)

Matthew Grayson

Author Affiliations +

Proceedings Volume 10180, Tri-Technology Device Refrigeration (TTDR) II; 1018009 (2017) https://doi.org/10.1117/12.2266121
Event: SPIE Defense + Security, 2017, Anaheim, CA, United States

Abstract

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Conference Presentation

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Matthew Grayson "Characterizing transverse thermoelectrics: Novel techniques for anisotropic ambipolar semiconductors (Conference Presentation)", Proc. SPIE 10180, Tri-Technology Device Refrigeration (TTDR) II, 1018009 (7 June 2017); https://doi.org/10.1117/12.2266121

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