Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10178, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, edited by Gerald C. Holst, Keith A. Krapels, Proceedings of SPIE Vol. 10178 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510608573

ISBN: 9781510608580 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00178_psisdg10178_1017801_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Bijl, Piet, 0O, 0U

Burks, Stephen D., 02

Bürsing, Helge, 0O

Cetin, Birkan, 10

Chen, FanSheng, 0Y

Cho, Min Ji, 07, 08

Choi, Jun-Hyuk, 0Z

Cuikun, 0Y

Doe, Joshua M., 02

Driggers, Ronald G., 0F

Du Bosq, Todd W., 0T

Durell, Chris, 04

Engel, Ezra, 0I

February, Faith J., 0E

Franks, Greg, 09

Gal, Raanan, 0P

Gerace, Aaron, 0R

Goss, Tristan M., 0L

Gross, Kevin C., 0A

Gueler, Richard, 06

Gunter, Willem H., 0E

Haefner, David P., 02, 05, 0B, 0D

Han, Kuk-Il, 0Z

Hixson, Jonathan G., 0Q, 0V

Hogervorst, Maarten A., 0U

Holst, Gerald C., 0K

Huang, Chao-Chun, 11

Hübner, M., 0C

Jablonski, Joe, 04

Kanan, Christopher, 0R

Kandemir, Kutlu D., 10

Kecskes, Ian, 0I

Keßler, Stefan, 0P

Kim, Do-Hwi, 0Z

Kim, Tae-Kuk, 0Z

King, D. Fred, 04

Kleynhans, Tania, 0R

Koerber, M., 0G

Labarre, Luc, 0O

LaVeigne, Joe, 04, 09

Lee, Hee Chul, 07, 08

Liuyan, 0Y

Lovejoy, McKenna R., 03

Maurer, Tana O., 0Q, 0W

May, Christopher M., 0Q, 0W

Mazz, John P., 0V

McHugh, Steve, 09

Miller, Brian, 0V

Montanaro, Matthew, 0R

Nehmetallah, George, 0M

Nelson, Michael B., 0Q

Okutomi, Masatoshi, 0X

Olson, Craig, 06

Pham, Justin R., 0Q

Preece, Bradley L., 05, 0M, 0T

Ramaswamy, Srinivasan, 0E

Repasi, Endre, 0G, 0O

Richards, A., 0C

Sanders, Jeffrey S., 0W

Shibata, Takashi, 0X

Shin, Uisub, 07, 08

Slonopas, Andre, 05

Sparks, Andrew, 06

Steward, Bryan J., 0A

Su, Xiaofeng, 0Y

Tanaka, Masayuki, 0X

Teaney, Brian P., 0B, 0H, 0Q

Thomson, George, 0I

Toet, Alexander, 0U

Vaitekunas, David A., 0E

Vollmerhausen, Richard H., 0F

Wang, Jun-Qi, 11

Wegner, D., 0G

Wickert, Mark A., 03

Willers, Cornelius J., 0L

Wittenstein, Wolfgang, 0O, 0P

Wolfe, Christopher M., 0I

Young, Shannon R., 0A

Conference Committee

Symposium Chair

  • Donald A. Reago Jr., U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Symposium Co-chair

  • Arthur A. Morrish, Raytheon Space and Airborne Systems (United States)

Conference Chairs

  • Gerald C. Holst, JCD Publishing (United States)

  • Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Conference Program Committee

  • Gisele Bennett, Georgia Institute of Technology (United States)

  • Piet Bijl, TNO Defence, Security and Safety (Netherlands)

  • James A. Dawson, Dynetics, Inc. (United States)

  • Russell Drake, Raytheon Network Centric Systems (United States)

  • Ronald G. Driggers, St. Johns Optical Systems (United States)

  • Richard L. Espinola, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • David P. Forrai, L-3 Communications Cincinnati Electronics (United States)

  • David P. Haefner, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • Alan Irwin, Santa Barbara Infrared, Inc. (United States)

  • Eddie L. Jacobs, University of Memphis (United States)

  • Terrence S. Lomheim, The Aerospace Corporation (United States)

  • Teresa L. Pace, University of Central Florida (United States)

  • Endre Repasi, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Joseph P. Reynolds, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • Michael A. Soel, FLIR Systems, Inc. (United States)

  • Andrew W. Sparks, L-3 Sonoma EO (United States)

  • Curtis M. Webb, Northrop Grumman Electronic Systems (United States)

  • 1 Testing

    • Ian Irwin, Santa Barbara Infrared, Inc. (United States)

    • Curtis M. Webb, Northrop Grumman Electronic Systems (United States)

  • 2 Hardware-in-the-Loop

    • lan Irwin, Santa Barbara Infrared, Inc. (United States)

    • Endre Repasi, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • 3 Modeling I

    • Gisele Bennett, Georgia Institute of Technology (United States)

    • Piet Bijl, TNO Defence, Security and Safety (Netherlands)

    • Andrew W. Sparks, L-3 Sonoma EO (United States)

  • 4 Modeling II

    • Gisele Bennett, Georgia Institute of Technology (United States)

    • Piet Bijl, TNO Defence, Security and Safety (Netherlands)

    • Andrew W. Sparks, L-3 Sonoma EO (United States)

  • 5 Modeling III

    • James A. Dawson, Dynetics, Inc. (United States)

    • Russell Drake, Raytheon Missile Systems (United States)

    • Ronald G. Driggers, St. Johns Optical Systems (United States)

  • 6 Modeling IV

    • Dave Forrai, L-3 Cincinnati Electronics (United States)

    • David P. Haefner, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

    • Michael A. Soel, FLIR Systems, Inc. (United States)

  • 7 Modeling V

    • Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

    • Eddie L. Jacobs, The University of Memphis (United States)

    • Terrence S. Lomheim, The Aerospace Corporation (United States)

    • Joseph P. Reynolds, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Introduction

This is the 28th year for our conference, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing. Over the years, we have witnessed the creation of IR focal plane arrays, IR scene projectors, MTF measurement techniques, and the Night Vision Integrated Performance Model (NVIPM). As government and private industry interests change, our conference has had swings in the number of papers presented and attendees. Currently, we seem to be on a rise.

We have not written an introduction to these proceedings for many years. The papers are self-explanatory and do not require any comment. We are pleased that all the authors provided professional presentations and quality manuscripts.

In 2016, our conference committee created a Best Paper Award based upon the presentation. In case of ties, the most downloaded paper is considered. We are proud to recognize:

Best presentation

David P. Haefner, Brian P. Teaney, and Bradley L. Preece, “Modeling demosaicing of color corrected cameras in the NV-IPM”, Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 982009 (May 3, 2016); doi:10.1117/12.2235781.

Most downloaded paper (first 3 months after publication)

Daniel Wegner and Endre Repasi, “Image based performance analysis of thermal imagers”, Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 982016 (May 3, 2016); doi:10.1117/12.2223629.

For 2017:

Best presentation

Austin A. Richards and Martin Huebner, “A new radiometric unit of measure to characterize SWIR illumination”, Proc. SPIE 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, 101780C (May 3, 2017); doi:10.1117/12.2261459.

Most downloaded paper (first 3 months after publication)

McKenna R. Lovejoy and Mark A. Wickert, “Testing of next-generation nonlinear calibration based non-uniformity correction techniques using SWIR devices”, Proc. SPIE 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, 1017803 (May 3, 2017); doi:10.1117/12.2262127.

Thank you to all who presented, the attendees, and our excellent conference committee.

Gerald C. Holst

Keith A. Krapels

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10178", Proc. SPIE 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, 1017801 (21 June 2017); https://doi.org/10.1117/12.2280573
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top