Wolter X-Ray Microscope Calibration

Michel Gerassimenko

doi:10.1117/12.936568

12 August 1986 Wolter X-Ray Microscope Calibration

Michel Gerassimenko

Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936568
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A 22 x Wolter microscope was calibrated after several months of operation in the Lawrence Livermore National Laboratory (LLNL) Inertial Confinement Fusion program. Placing a point x-ray source at the microscope focus, I recorded the image plane spectrum, as well as the direct spectrum, and from the ratio of these two spectra derived an accurate estimate of the microscope solid angle in the 1-4 keV range. The solid angle was also calculated using the microscope geometry and composition. Comparison of this calculated value with the solid angle that was actually measured suggests contamination of the microscope surface.

Citation Download Citation

Michel Gerassimenko "Wolter X-Ray Microscope Calibration", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936568

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