Crystal R[sub]c[/sub] Calibrations with an Uncollimated, Point X-Ray Source

Paul D. Rockett; C. R. Bird; C. J. Hailey; Z. Koenig; J. Lupton; J. Geddes

doi:10.1117/12.936573

12 August 1986 Crystal R_c Calibrations with an Uncollimated, Point X-Ray Source

Paul D. Rockett, C. R. Bird, C. J. Hailey, Z. Koenig, J. Lupton, J. Geddes

Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936573
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The calibration of crystal integrated reflectivity can be faithfully performed with an uncollimated, well-filtered point x-ray source. In this geometry the angle of illumination of the crystal greatly exceeds the crystal rocking angle. The crystal essentially collimates the scattered beam, establishing the detector acceptance angle. We have measured single crystal Rc's in this way for a variety of crystals including PET, Beryl, LiF (200), several synthetic multilayers, silicon (111), and KAP. In addition we report the first measured Rc for convex curved metal multilayer crystals.

Citation Download Citation

Paul D. Rockett, C. R. Bird, C. J. Hailey, Z. Koenig, J. Lupton, and J. Geddes "Crystal R_c Calibrations with an Uncollimated, Point X-Ray Source", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936573

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