Paper
1 May 1986 Numerical System For Infrared Scanners And Application To The Subsurface Control Of Materials By Photothermal Radiometry
Jean Louis Beaudoin, Etienne Merienne, Raphael Danjoux, Michel Egee
Author Affiliations +
Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951996
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Non-destructive testing (NDT) of materials can be achieved via proper photonic excitation and radiometric monitoring of the induced thermal changes. The theoretical support for this photothermal conversion in bi-layered materials is proposed, single-pulse and periodically modulated fluxes being considered. Some practical proposals are derived concerning the various aims of NDT: coatings thickness measurements, detection of defective bondings or delaminations, measurements of contact resistances between two layers. Measurements performed with a commercially available infra-red scanner and a digital data acquisition and processing system are reported.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Louis Beaudoin, Etienne Merienne, Raphael Danjoux, and Michel Egee "Numerical System For Infrared Scanners And Application To The Subsurface Control Of Materials By Photothermal Radiometry", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.951996
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KEYWORDS
Resistance

Scanners

Thermography

Nondestructive evaluation

Data acquisition

Infrared technology

Radiometry

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