Thin Film Diagnostics With Surface Coherent Raman Scattering

G. I. Stegeman; R. Fortenberry; R. Moshref zadeh; W. M. Hetherington III; N. E. Van Wyck; E. W. Koenig

doi:10.1117/12.934768

7 November 1983 Thin Film Diagnostics With Surface Coherent Raman Scattering

G. I. Stegeman, R. Fortenberry, R. Moshref zadeh, W. M. Hetherington III, N. E. Van Wyck, E. W. Koenig

Proceedings Volume 0380, Los Alamos Conf on Optics '83; (1983) https://doi.org/10.1117/12.934768
Event: Los Alamos Conference on Optics, 1983, New Mexico, United States

Abstract

We predict theoretically and verify experimentally that coherent Stokes (and anti-Stokes) Raman scattering is an efficient method for obtaining the Raman spectrum of a film, provided that the incident and scattered fields are guided by the film. Further calculations indicate that by using various combinations of guided wave modes it should be possible to locate impurities in a thin film.

Citation Download Citation

G. I. Stegeman, R. Fortenberry, R. Moshref zadeh, W. M. Hetherington III, N. E. Van Wyck, and E. W. Koenig "Thin Film Diagnostics With Surface Coherent Raman Scattering", Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983); https://doi.org/10.1117/12.934768

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