PROCEEDINGS VOLUME 8975
SPIE MOEMS-MEMS | 1-6 FEBRUARY 2014
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
Editor Affiliations +
IN THIS VOLUME

6 Sessions, 22 Papers, 0 Presentations
Session 1  (4)
Session 2  (6)
Session 3  (5)
Session 4  (5)
Proceedings Volume 8975 is from: Logo
SPIE MOEMS-MEMS
1-6 February 2014
San Francisco, California, United States
Front Matter: Volume 8975
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897501 (2014) https://doi.org/10.1117/12.2062762
Session 1
C. Fu, O. Elmarzia, K. Lee
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897503 (2014) https://doi.org/10.1117/12.2041892
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897504 (2014) https://doi.org/10.1117/12.2040030
Brad Holschuh, Dava Newman
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897505 (2014) https://doi.org/10.1117/12.2044406
Norihisa Miki, Yumi Kosemura, Junpei Watanabe, Hiroaki Ishikawa
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897506 (2014) https://doi.org/10.1117/12.2044127
Session 2
Heather C. Chiamori, Minmin Hou, Caitlin A. Chapin, Ashwin Shankar, Debbie G. Senesky
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897507 (2014) https://doi.org/10.1117/12.2046690
T. Bandi, X. Maeder, A. Dommann, H. Shea, A. Neels
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 897509 (2014) https://doi.org/10.1117/12.2044212
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750A (2014) https://doi.org/10.1117/12.2039052
Ke Lin, Yanguang Yu, Jiangtao Xi, Yuanlong Fan, Huijun Li
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750B (2014) https://doi.org/10.1117/12.2039004
Denis G. Dufour, Patrice Topart, Bruno Tremblay, Christian Julien, Louis Martin, Carl Vachon
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750C (2014) https://doi.org/10.1117/12.2040201
Weihe Xu, Hamid Hadim, Yong S. Chu, Yong Shi, Evgeny Nazaretski
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750D (2014) https://doi.org/10.1117/12.2054464
Session 3
Patrice Topart, Francis Picard, Samir Ilias, Christine Alain, Claude Chevalier, Bruno Fisette, Jacques E. Paultre, Francis Généreux, Mathieu Legros, et al.
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750E (2014) https://doi.org/10.1117/12.2041576
Christopher Stilson, Ronald Coutu Jr.
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750F (2014) https://doi.org/10.1117/12.2037355
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750H (2014) https://doi.org/10.1117/12.2037182
T. Bandi, J. Baborowski, A. Dommann, H. Shea, F. Cardot, A. Neels
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750I (2014) https://doi.org/10.1117/12.2044209
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750J (2014) https://doi.org/10.1117/12.2038319
Session 4
Chuang-hua Yang, Zhong-Yuan Yu, Peng-Fei Lu, Yu-min Liu, Saima Manzoor, Ming Li, Shuai Zhou
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750K (2014) https://doi.org/10.1117/12.2038401
Yan Gao, Yanguang Yu, Ke Lin, Jiangtao Xi
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750L (2014) https://doi.org/10.1117/12.2038985
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750M (2014) https://doi.org/10.1117/12.2039464
Joung-Man Park, Dong-Jun Kwon, Zuo-Jia Wang, Lawrence DeVries
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750O (2014) https://doi.org/10.1117/12.2035661
A. V. S. S. Prasad, Venkatesh K. P., Navakanta Bhat, Rudra Pratap
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750P (2014) https://doi.org/10.1117/12.2038822
Poster Session
Dong Uk Kim, Seon Young Ryu, Jun Ki Kim, Ki Soo Chang
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII, 89750Q (2014) https://doi.org/10.1117/12.2041052
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