PROCEEDINGS VOLUME 4101
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Laser Interferometry X: Techniques and Analysis
Editor Affiliations +
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
New Techniques
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498391
Alexander V. Tavrov, Yoko Miyamoto, Tsutomu Kawabata, Mitsuo Takeda, Vladimir A. Andreev
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498420
Malgorzata Kujawinska, Michal Emanuel Pawlowski
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498390
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498449
Fringe Pattern Analysis
Zongtao Ge, Fumio Kobayashi, Shinichi Matsuda, Mitsuo Takeda
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498424
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498386
Parameswaran Hariharan, Emily J. Pryputniewicz, Ryszard J. Pryputniewicz
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498384
Joseph E. Hayden, Timothy S. Lewis
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498428
Holography and ESPI
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498385
Armando Albertazzi Jr., Cesar Kanda, Maikon R. Borges, Frank Hrebabetzky
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498423
Arne Kraft, Gerd Guelker, Klaus D. Hinsch, A. Eljarad
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498431
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498394
ESPI and ESPSI
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498433
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498429
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498430
Optical Micromeasurement
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498436
Huimin Xie, Gin Boay Chai, Anand Krishna Asundi, Jin Yu, Yunguang Lu, Bryan Kok Ann Ngoi, Zhaowei Zhong, Satoshi Kishimoto
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498437
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498439
Santiago Royo, Josep Arasa, Jesus Caum
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498438
Optical Profilometry
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498445
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498419
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498432
Mingyi Chen, Hongwei Guo, Weiming Cheng
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498434
Poster Session
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498450
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498448
Rajpal S. Sirohi, Baij Nath Gupta
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498447
Chunlong Wei, Mingyi Chen, Yingjie Yu, Hongwei Guo, Guodong Li
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498435
Bangke Zheng, Paul Choon Keat Lee
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498427
Ventseslav Christov Sainov, Nikola Metchkarov, Valentin A. Kostov, Wolfgang Osten
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498421
Hongwei Guo, Mingyi Chen, Chunlong Wei
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498408
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498388
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498422
Yingjie Yu, Chunlong Wei, Mingyi Chen, Hongwei Guo
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498409
Displacement, Vibration, and Dynamic Measurements
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498381
Mitchell M. Marchi, Fang Chen, Pat Harwood, R. Linder, Gordon M. Brown
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498401
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498399
Stephen G. Grantham, William G. Proud, Howell Timothy Goldrein, John E. Field
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498392
Distance and Shape Measurements
Ichirou Yamaguchi, Jun-ichi Kato, Sohgo Ohta, Junko Mizuno
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498395
Thierry M. Bosch, Noel Servagent
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498414
Thierry M. Bosch, Noel Servagent
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498413
Pierre M. Jacquot, Massimo Facchini, Muriel Mattenet, Gerhard Gruebel
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498444
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498443
Strain, Stress, and Deformation Measurements
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498389
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498404
Per Synnergren, Mikael Sjoedahl
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498442
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498410
NDT and Materials Characterization
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498441
Wolfgang Osten, Michael K. Kalms, Werner P. O. Jueptner, Gustav Tober, Wolfgang Bisle, Dieter Scherling
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498440
Hans Rottenkolber, Werner P. O. Jueptner
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498393
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498411
Optical Surface Characterization
Volker Kebbel, Hans-Juergen Hartmann, Werner P. O. Jueptner, Ulf Schnars, Laura Gatti, Joachim Becker
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498398
Volker Kebbel, Hans-Juergen Hartmann, Werner P. O. Jueptner
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498397
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498416
Horst Konstantin Mischo, Tilo Pfeifer, Frank Bitte
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498406
Alexander Bai, Frank Bitte, Horst Konstantin Mischo, Tilo Pfeifer
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498405
MEMS and Microcomponent Applications
Gordon C. Brown, Ryszard J. Pryputniewicz, Maarten P. DeBoer, Samuel L. Miller
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498383
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498407
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498412
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498417
Poster Session
Igor Victorovic Ershov, Yuriy D. Babichev
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498418
Khaled J. Habib, Sami J. Habib
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498387
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498380
NDT and Materials Characterization
Vadim K. Milyukov, Valentina V. Azarova, Yuri Goliaev, Tatiana I. Solovieva
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498379
Poster Session
Xiaoyuan Peng, Anand Krishna Asundi, Yihong Chen, Zhengjun Xiong, Gnian Cher Lim
Proceedings Volume Laser Interferometry X: Techniques and Analysis, (2006) https://doi.org/10.1117/12.498378
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