Yiguang Zhang
at The China Aerospace Industry Corp.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 August 2009 Paper
Yi-guang Zhang, Zhi-xiang Yin, Jian-fei Qin
Proceedings Volume 7383, 73830M (2009) https://doi.org/10.1117/12.833701
KEYWORDS: Sensors, Infrared detectors, Prototyping, Image quality, Temperature metrology, Microbolometers, Infrared sensors, Control systems, Temperature sensors, Manufacturing

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