Xu Yan
at SIMIT
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 August 2009 Paper
X. Yan, F. Feng, Y. Wang
Proceedings Volume 7383, 73834S (2009) https://doi.org/10.1117/12.834912
KEYWORDS: Reflectivity, Infrared radiation, Thermography, Absorption, Thermal optics, Staring arrays, Glasses, Silicon films, Silicon, Temperature metrology

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