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Ujwala Manivannan
at Canadian Grain Commission
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Publications (1)
SPIE Journal Paper | 1 October 2004
Determination of short-term sequential scan variability in a scanner-based machine vision system for grain grading
Muhammad Shahin, Annie Meng, Stephen Symons, Elinor Dorrian, Ujwala Manivannan
JEI, Vol. 13, Issue 04, (October 2004) https://doi.org/10.1117/12.10.1117/1.1792649
KEYWORDS: Scanners, Machine vision, Imaging systems, Distance measurement, Tolerancing, Imaging devices, Calibration, Image acquisition, Image analysis, Inspection
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