Thomas E. Murphy
LED Product Manager at Hymite GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 September 2007 Paper
Tom Murphy, Steen Weichel, Steven Isaacs, Jochen Kuhmann
Proceedings Volume 6797, 67970F (2007) https://doi.org/10.1117/12.753085
KEYWORDS: Light emitting diodes, Silicon, Semiconducting wafers, Metals, Packaging, Resistance, Reliability, Temperature metrology, Thermography, Thermal modeling

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