Mr. Hyung Il Koo Profile

Hyung Il Koo

at Ajou Univ

SPIE Involvement:

Author

Publications (6)

SPIE Journal Paper | 9 November 2016

Multiorientation/multiscript scene text detection based on projection profile analysis and graph segmentation

Hyung Il Koo

JEI, Vol. 25, Issue 06, 063001, (November 2016) https://doi.org/10.1117/12.10.1117/1.JEI.25.6.063001

KEYWORDS: Image segmentation, Image processing, Algorithm development, Distance measurement, Binary data, Analytical research, Feature extraction, Navigation systems, Cameras, Detector development

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SPIE Journal Paper | 9 June 2016

Robust skew estimation using straight lines in document images

Hyung Il Koo, Nam Ik Cho

JEI, Vol. 25, Issue 03, 033014, (June 2016) https://doi.org/10.1117/12.10.1117/1.JEI.25.3.033014

KEYWORDS: Sensors, Algorithm development, Image segmentation, Databases, Edge detection, Image analysis, Image processing, Detection and tracking algorithms, Optical character recognition, Binary data

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SPIE Journal Paper | 12 May 2015

Unified framework for automatic image stitching and rectification

Jaehyun An, Beom Su Kim, Hyung-Il Koo, Nam Ik Cho

JEI, Vol. 24, Issue 03, 033007, (May 2015) https://doi.org/10.1117/12.10.1117/1.JEI.24.3.033007

KEYWORDS: Cameras, Image registration, Algorithm development, Reconstruction algorithms, Image processing, Visualization, Composites, Detection and tracking algorithms, Motion estimation, Image resolution

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SPIE Journal Paper | 31 January 2013

Skew estimation of natural images based on a salient line detector

Hyung-Il Koo, Nam Ik Cho

JEI, Vol. 22, Issue 01, 013020, (January 2013) https://doi.org/10.1117/12.10.1117/1.JEI.22.1.013020

KEYWORDS: Sensors, Image analysis, Edge detection, Error analysis, Algorithm development, Hough transforms, Cameras, Sensor performance, Statistical analysis, Electronic imaging

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SPIE Journal Paper | 1 January 2011 Open Access

Colorization based on soft segmentation

Hyung-Il Koo, Nam-Ik Cho

JEI, Vol. 20, Issue 1, 010502, (January 2011) https://doi.org/10.1117/12.10.1117/1.3565470

KEYWORDS: Image segmentation, Image processing algorithms and systems, 3D image processing, Visualization, Error analysis, Information technology, Image processing, Chromium

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SPIE Journal Paper | 1 April 2010 Open Access

New automatic defect classification algorithm based on a classification-after-segmentation framework

Sang-Hak Lee, Hyung-Il Koo, Nam-Ik Cho

JEI, Vol. 19, Issue 02, 020502, (April 2010) https://doi.org/10.1117/12.10.1117/1.3429116

KEYWORDS: Image segmentation, Particles, Semiconducting wafers, Feature extraction, Image processing, Image classification, Image filtering, Semiconductors, Data modeling, Algorithm development

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