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JEI Letters

Special Section on Quality Control by Artificial Vision

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Jean-Charles Pinoli; Karen Panetta; Seiji Hata
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.021101

Open Access Open Access

Topics: Machine vision
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Beata Oswald-Tranta; Paul O’Leary
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.021108
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Michael Gadermayr; Andreas Maier; Andreas Uhl
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.021109
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Regular Articles

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Kyoji Matsushima; Hirohito Nishi; Sumio Nakahara
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023002

Open Access Open Access

Includes: Supplemental Content
Topics:
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Tae Hwan Lee; Jin-Ku Kang; Byung Cheol Song
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023004
Topics:
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Zemin Ren; Chuanjiang He; Meng Li
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023006
Topics:
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Liquan Shen; Zhaoyang Zhang
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023009
Topics:
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Jia Liu; Jie Yang
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023010
Topics: Matrices, Video
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Mingze Li; Fei Liu; Bin Zhang; Jing Bai
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023014
Topics:
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William Robson Schwartz; Fernando Roberti de Siqueira; Helio Pedrini
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023016
Topics:
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Rangaraj M. Rangayyan; Faraz Oloumi
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023018
Topics:
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Silvia M. Ojeda; Ronny O. Vallejos; Pedro W. Lamberti
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023019
Topics:
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Quanli Wang; Mike West
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023020
Topics:
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Zhaohui Wang; Jon Yngve Hardeberg
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023021
Topics:
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Muhammad Imran Iqbal; Hans-Jürgen Zepernick
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023022
Topics:
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Osama S. Faragallah
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023024
Topics:
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Dae-Young Hyun; Jun-Hee Heu; Chang-Su Kim; Sang-Uk Lee
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023027
Topics:
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Herng-Hua Chang; Woei-Chyn Chu
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023028
Topics:
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Yan Wang; Chuanjiang He
J. Electron. Imaging.   doi: 10.1117/1.JEI.21.2.023030
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