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JEI Letters

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Yik-Hing Fung; Yuk-Hee Chan
J. Electron. Imaging.   doi: 10.1117/1.3479749

Open Access Open Access

Special Section on Quality Control by Artificial Vision

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Edmund Y. Lam; Shaun S. Gleason; Kurt S. Niel
J. Electron. Imaging.   doi: 10.1117/1.3497000

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Topics: Machine vision
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Tarek Yahiaoui; Louahdi Khoudour; Cyril Meurie
J. Electron. Imaging.   doi: 10.1117/1.3455989
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Paul O’Leary; Matthew Harker; Bernhard Mörtl
J. Electron. Imaging.   doi: 10.1117/1.3455988
Topics: Matrices, Modeling
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Philip Bingham; Lloyd Arrowood
J. Electron. Imaging.   doi: 10.1117/1.3489122

Regular Articles

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Yongxin Ge; Dan Yang; Xiaohong Zhang; Jiwen Lu
J. Electron. Imaging.   doi: 10.1117/1.3455428
Topics: Video
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Max Mignotte
J. Electron. Imaging.   doi: 10.1117/1.3466799
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Cheolkon Jung; Licheng Jiao; Hyungseok Kim; Joongkyu Kim
J. Electron. Imaging.   doi: 10.1117/1.3466800
Topics: Image denoising
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Hai Shan Wu; Yan Qiu Chen
J. Electron. Imaging.   doi: 10.1117/1.3475952
Topics: Nose, Databases
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Yung-Chiang Wei; Jar-Ferr Yang
J. Electron. Imaging.   doi: 10.1117/1.3476330
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Salah Bourennane; Caroline Fossati; William Ketchantang
J. Electron. Imaging.   doi: 10.1117/1.3478885
Topics: Iris

Book Reviews

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J. Electron. Imaging.   doi: 10.1117/1.3487487

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