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JEI Letters

Special Section on Quality Control by Artificial Vision

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Hamed Sari-Sarraf; David Fofi; Nelson H. C. Yung
J. Electron. Imaging.   doi: 10.1117/1.2959057

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Topics: Machine vision

Quality Control by Artificial Vision

Regular Articles

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Jee Hong Kim
J. Electron. Imaging.   doi: 10.1117/1.2952589
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Maya R. Gupta; Eric K. Garcia; Andrey Stroilov
J. Electron. Imaging.   doi: 10.1117/1.2955968

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Chuen-Ching Wang; Yu-Chang Hsu
J. Electron. Imaging.   doi: 10.1117/1.2954128
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Yannick Caulier; Klaus Spinnler; Thomas Wittenberg; Salah Bourennane
J. Electron. Imaging.   doi: 10.1117/1.2954127
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Huei-Yung Lin; Chia-Hong Chang
J. Electron. Imaging.   doi: 10.1117/1.2952845
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Chee Sun Won
J. Electron. Imaging.   doi: 10.1117/1.2970151
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Shiueng-Bien Yang
J. Electron. Imaging.   doi: 10.1117/1.2976421
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Khalil Hachicha; Patrick Garda
J. Electron. Imaging.   doi: 10.1117/1.2987724

Errata

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Kyung-Hoon Bae; Jung-Hwan Ko; Jung-Suk Lee
J. Electron. Imaging.   doi: 10.1117/1.2976106

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Book Reviews

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J. Electron. Imaging.   doi: 10.1117/1.2967341

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Topics: Multimedia
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