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JEI Letters

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Sungchan Park; Hong Jeong
J. Electron. Imaging.   doi: 10.1117/1.2892680

Open Access Open Access

Special Section on Biometrics: Advances in Security, Usability, and Interoperability

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Vitomir Štruc; France Mihelič; Nikola Pavešić
J. Electron. Imaging.   doi: 10.1117/1.2885149
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Emanuele Maiorana; Patrizio Campisi; Alessandro Neri
J. Electron. Imaging.   doi: 10.1117/1.2885239
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Utpal Garain; Swapan K. Parui; Thierry Paquet; Laurent Heutte
J. Electron. Imaging.   doi: 10.1117/1.2891333
Topics: Databases
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Andreas Humm; Jean Hennebert; Rolf Ingold
J. Electron. Imaging.   doi: 10.1117/1.2898526
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Andreas Uhl; Peter Wild
J. Electron. Imaging.   doi: 10.1117/1.2892674
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Xiaoxin Shang; Raymond N. J. Veldhuis
J. Electron. Imaging.   doi: 10.1117/1.2892675

Regular Articles

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Adrian Stern; Etan Fisher
J. Electron. Imaging.   doi: 10.1117/1.2892676
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Justin R. Boyle; Anthony J. Maeder; Wageeh W. Boles
J. Electron. Imaging.   doi: 10.1117/1.2841708
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Vishal Monga; Shen-ge Wang; Raja Bala
J. Electron. Imaging.   doi: 10.1117/1.2898128
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Do Nyeon Kim; Kamisetty R. Rao
J. Electron. Imaging.   doi: 10.1117/1.2885257
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Ying-Wen Chang; Yen-Yu Chen
J. Electron. Imaging.   doi: 10.1117/1.2892682
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Wen-Ze Shao; Zhi-Hui Wei
J. Electron. Imaging.   doi: 10.1117/1.2898114
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Peng Zhao; Zhongliang Jing; Shiqiang Hu
J. Electron. Imaging.   doi: 10.1117/1.2898535
Topics: Image fusion
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Frederic Ros; Jerome Borla; Rachid Harba
J. Electron. Imaging.   doi: 10.1117/1.2841714

Book Reviews

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Per Christian Hansen; James G. Nagy; Dianne P. Leary
J. Electron. Imaging.   doi: 10.1117/1.2900557

Open Access Open Access

Topics: Matrices
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