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Special Section on Quality Control by Artificial Vision

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Kenneth W. Tobin; Fabrice Meriaudeau; Luciano da Fontoura Costa
J. Electron. Imaging.   doi: 10.1117/1.1775236
Topics: Machine vision
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Thomas Heger; Madhukar Pandit
J. Electron. Imaging.   doi: 10.1117/1.1760757
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Edward R. Dougherty
J. Electron. Imaging.   doi: 10.1117/1.1762520
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Paul O’Leary; Paul Zsombor-Murray
J. Electron. Imaging.   doi: 10.1117/1.1758951
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Jian Fu; H. John Caulfield; Surendar R. Pulusani
J. Electron. Imaging.   doi: 10.1117/1.1760081
Topics: Color vision

Image and Video Enhancement

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Ziya Telatar
J. Electron. Imaging.   doi: 10.1117/1.1758271
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William E. Glenn
J. Electron. Imaging.   doi: 10.1117/1.1762887
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Byoung-Ki Jeon; Jeong-Hun Jang; Ki-Sang Hong
J. Electron. Imaging.   doi: 10.1117/1.1758952
Topics: Edge detection

Image Segmentation and Analysis

Color Image Processing

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Katherine R. Weber; Scott T. Acton
J. Electron. Imaging.   doi: 10.1117/1.1762890

Halftoning, Compression, and Cryptography

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Yuk-Hee Chan; Sin-Ming Cheung
J. Electron. Imaging.   doi: 10.1117/1.1758728
Topics: Diffusion
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Mizuho Nakajima; Yasushi Yamaguchi
J. Electron. Imaging.   doi: 10.1117/1.1758729
Topics: Cryptography

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