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SPECIAL SECTION ON HUMAN VISION AND ELECTRONIC IMAGING

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Andrew B. Watson; James Hu; John F. McGowan
J. Electron. Imaging.   doi: 10.1117/1.1329896
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Huib de Ridder
J. Electron. Imaging.   doi: 10.1117/1.1335529
Topics: Image quality
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Otto H. MacLin; Michael A. Webster
J. Electron. Imaging.   doi: 10.1117/1.1330573
Topics: Distortion
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John McCann
J. Electron. Imaging.   doi: 10.1117/1.1333678
Topics: Diamond, Displays, Vision
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Roger A. Browse; James C. Rodger; Robert A. Adderley
J. Electron. Imaging.   doi: 10.1117/1.1330574

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTION

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Kenneth W. Tobin; John W. V. Miller
J. Electron. Imaging.   doi: 10.1117/1.1337356

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGE UNDERSTANDING AND SCENE ANALYSIS

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGE-BASED METROLOGY

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONSURFACE AND 3-D IMAGING

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONINDUSTRIAL APPLICATIONS

SPECIAL SECTION ON MACHINE VISION FOR INDUSTRIAL INSPECTIONIMAGING ARCHITECTURES

COMPRESSION AND CODING

DIGITAL IMAGING PROCESSING

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Bruno Aiazzi; Luciano Alparone; Stefano Baronti; Andrea Garzelli
J. Electron. Imaging.   doi: 10.1117/1.1314621

DISPLAY DEVICES

MACHINE VISION

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Shang-Hong Lai; Ming Fang
J. Electron. Imaging.   doi: 10.1117/1.1313240

EDITORIAL

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Edward R. Dougherty
J. Electron. Imaging.   doi: 10.1117/1.1345037
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