A novel method for evaluating the validity of the visual attended regions based on SIFT descriptors

Jie Xiao; Mingyue Ding; Chao Cai; Chengping Zhou

doi:10.1117/12.832638

30 October 2009 A novel method for evaluating the validity of the visual attended regions based on SIFT descriptors

Jie Xiao, Mingyue Ding, Chao Cai, Chengping Zhou

Proceedings Volume 7496, MIPPR 2009: Pattern Recognition and Computer Vision; 749604 (2009) https://doi.org/10.1117/12.832638
Event: Sixth International Symposium on Multispectral Image Processing and Pattern Recognition, 2009, Yichang, China

Abstract

Selective visual attention can direct our gaze rapidly towards objects of interest in the view. Better coverage of target region for attention can better serve for recognition. A novel method for evaluating how well the attended regions contribute to the recognition of the target based on SIFT descriptors is proposed in this paper. The method is used to evaluate the attended regions extracted by some visual attention mechanisms on real remote sensor images with different geometric and photometric transformations and for different scene types. The evaluation method proposed in this paper give an explicit, accurate and robust expression about the attended region in visual attention mechanisms and we believe this method could be applicable in visual attention mechanisms in the future work.

Citation Download Citation

Jie Xiao, Mingyue Ding, Chao Cai, and Chengping Zhou "A novel method for evaluating the validity of the visual attended regions based on SIFT descriptors", Proc. SPIE 7496, MIPPR 2009: Pattern Recognition and Computer Vision, 749604 (30 October 2009); https://doi.org/10.1117/12.832638

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