Evaluating laser range scanner lateral resolution in 3D metrology

David MacKinnon; J. Angelo Beraldin; Luc Cournoyer; Francois Blais

doi:10.1117/12.805868

19 January 2009 Evaluating laser range scanner lateral resolution in 3D metrology

David MacKinnon, J. Angelo Beraldin, Luc Cournoyer, Francois Blais

Proceedings Volume 7239, Three-Dimensional Imaging Metrology; 72390P (2009) https://doi.org/10.1117/12.805868
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States

Abstract

In this study, laser range scanner lateral resolution is investigated for laser range scanners. A standardized method is proposed and demonstrated for quantifying the lateral surface resolvability of a laser range scanner through the use of an appropriately-designed artefact. A new metric for lateral surface resolution, the limit of surface resolvability, is presented and is obtained using what is referred to as the wedge test. The results of applying this metrics using this test method to laser range scanners is also presented.

Citation Download Citation

David MacKinnon, J. Angelo Beraldin, Luc Cournoyer, and Francois Blais "Evaluating laser range scanner lateral resolution in 3D metrology", Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390P (19 January 2009); https://doi.org/10.1117/12.805868

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