Oil contamination level measurement based on microscopic digital image processing

Chuan Li; Xianming Zhang; Yutao Dong; Ge Liu; Jing Chen

doi:10.1117/12.807701

28 January 2009 Oil contamination level measurement based on microscopic digital image processing

Chuan Li, Xianming Zhang, Yutao Dong, Ge Liu, Jing Chen

Proceedings Volume 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments; 71562Q (2009) https://doi.org/10.1117/12.807701
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

To control oil contamination is one of the most important tasks in operating a mechanical device. Oil contamination level is a quantitative parameter used to determine the level of contamination by measuring the number, sizes and distributions of solid particles in an oil substance. According to classification standards of particles contamination level, a novel method with microscopic digital image processing is proposed to measure it. At first the oil sample to be measured is filtered by a vacuum assisted device to gather the solid particles. The filter paper is placed in between two glasses, and the microscopic digital images of it are captured by an optical microscope and a Charge Coupled Device (CCD) camera. The images are then segmented and extracted accordingly. After processing these images, binary images are produced to facilitate the measurement of particle size distribution, which is used to classify the contamination level. Thanks to the application of microscopic digital image processing, the proposed method is able to produce a reliable result with much cheaper expense, which was proven by the results of an experiment.

Citation Download Citation

Chuan Li, Xianming Zhang, Yutao Dong, Ge Liu, and Jing Chen "Oil contamination level measurement based on microscopic digital image processing", Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Q (28 January 2009); https://doi.org/10.1117/12.807701

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available