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17 January 2008 Research on a real-time scanning tunneling microscope data acquisition system (Notice of Removal)
Chang Xu, Baoping Xiao, Lijun Xu
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Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67233A (2008) https://doi.org/10.1117/12.783484
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
This paper (67233A) was removed from the SPIE Digital Library on 13 April 2010 to discovery of plagiarism. As stated in the SPIE Guidelines for Professional Conduct and Publishing Ethics, SPIE defines plagiarism as the reuse of someone else's prior ideas, processes, results, or words without explicit attribution of the original author and source, or falsely representing someone else's work as one's own. SPIE considers plagiarism in any form, at any level, to be unacceptable and a serious breach of professional conduct. It is SPIE policy to remove such papers and to take appropriate corrective or disciplinary action against the offending author(s).
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Chang Xu, Baoping Xiao, and Lijun Xu "Research on a real-time scanning tunneling microscope data acquisition system (Notice of Removal)", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67233A (17 January 2008); https://doi.org/10.1117/12.783484
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KEYWORDS
Scanning tunneling microscopy
Data acquisition
Human-machine interfaces
Analog electronics
Metals
Java
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