Modelling and predicting flow regimes using wavelet representations

David A. Goodwin; Stuart Barber; Robert G. Aykroyd

doi:10.1117/12.692645

12 October 2006 Modelling and predicting flow regimes using wavelet representations

David A. Goodwin, Stuart Barber, Robert G. Aykroyd

Proceedings Volume 6383, Wavelet Applications in Industrial Processing IV; 638305 (2006) https://doi.org/10.1117/12.692645
Event: Optics East 2006, 2006, Boston, Massachusetts, United States

Abstract

The aim of industrial process control is to convert measurements, taken while the process is evolving, into parameters which can be used to control the process. To be of practical use this must all be computationally efficient allowing real-time feedback. Electrical tomography measurements have the potential to provide useful data without intruding into the industrial process, but produce highly correlated and noisy data, and hence need sensitive analysis. The commonly used approaches, based on regularized image reconstruction are slow, and still require image post-processing to extract control parameters. An alternative approach is to directly work with the measurement data. We demonstrate an approach using wavelets to relate such electrical measurements to the state of flow within a pipe, and hence classify the state of the flow to one of a number of regimes. Wavelets are an ideal tool for our purpose since their multi-scale nature enables the efficient description of both transient and long-term signals. The resulting wavelet models can be used to classify flow into one of a set of regimes, either for later study of the flow profile or for monitoring of an ongoing process. We illustrate our methods by application to simulated data sets.

Citation Download Citation

David A. Goodwin, Stuart Barber, and Robert G. Aykroyd "Modelling and predicting flow regimes using wavelet representations", Proc. SPIE 6383, Wavelet Applications in Industrial Processing IV, 638305 (12 October 2006); https://doi.org/10.1117/12.692645

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