Paper
3 May 2004 Machine vision system for surface inspection on brushed industrial parts
Nicolas Bonnot, Ralph Seulin, Frederic Merienne
Author Affiliations +
Proceedings Volume 5303, Machine Vision Applications in Industrial Inspection XII; (2004) https://doi.org/10.1117/12.530683
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Abstract
This work aims at detecting defects on metallic industrial parts with streaked surface. The orientation of those parallel streaks is totally random. The searched defects are scratch and lack of machining. A specific machine vision system has been designed to deal with the particular inspected surface features. One image is acquired with an annular lighting in bright field and six images are acquired with a rotating lighting in dark field. A particular image processing is applied on the six images in order to get one image that represents all the revealed imperfections. A thresholding processing is then applied on this image in order to segment the imperfections. A trained classification, created with well known typical objects of each class, is performed. The classification has to recognize the different defects and the small imperfections that are not defects. The decision phase is used to know if the defects are acceptable, and therefore if the inspected part is acceptable. Some acceptability rules are defined for every defect class. The developed machine vision system has been implemented on an experimental industrial production line and it gives 2% of sub-detection and 16% of over-detection.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicolas Bonnot, Ralph Seulin, and Frederic Merienne "Machine vision system for surface inspection on brushed industrial parts", Proc. SPIE 5303, Machine Vision Applications in Industrial Inspection XII, (3 May 2004); https://doi.org/10.1117/12.530683
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CITATIONS
Cited by 10 scholarly publications and 1 patent.
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KEYWORDS
Light sources and illumination

Inspection

Machine vision

Image processing

Image segmentation

Manufacturing

Cameras

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