Paper
28 May 2004 Using independent component analysis for electrical impedance tomography
Peimin Yan, Yulong Mo
Author Affiliations +
Proceedings Volume 5298, Image Processing: Algorithms and Systems III; (2004) https://doi.org/10.1117/12.525632
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Abstract
Independent component analysis (ICA) is a way to resolve signals into independent components based on the statistical characteristics of the signals. It is a method for factoring probability densities of measured signals into a set of densities that are as statistically independent as possible under the assumptions of a linear model. Electrical impedance tomography (EIT) is used to detect variations of the electric conductivity of the human body. Because there are variations of the conductivity distributions inside the body, EIT presents multi-channel data. In order to get all information contained in different location of tissue it is necessary to image the individual conductivity distribution. In this paper we consider to apply ICA to EIT on the signal subspace (individual conductivity distribution). Using ICA the signal subspace will then be decomposed into statistically independent components. The individual conductivity distribution can be reconstructed by the sensitivity theorem in this paper. Compute simulations show that the full information contained in the multi-conductivity distribution will be obtained by this method.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peimin Yan and Yulong Mo "Using independent component analysis for electrical impedance tomography", Proc. SPIE 5298, Image Processing: Algorithms and Systems III, (28 May 2004); https://doi.org/10.1117/12.525632
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KEYWORDS
Independent component analysis

Reconstruction algorithms

Tomography

Finite element methods

Electrodes

Computer simulations

Inverse problems

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