Paper
4 June 2001 Time series inference from clustering
Edward R. Dougherty, Junior Barrera, Marcel Brun, Seungchan Kim, Roberto M. Cesar, Yidong Chen, Michael L. Bittner, Jeffrey M. Trent
Author Affiliations +
Abstract
This paper presents a toolbox for analyzing inferences drawn from clustering. Often the implication is that points in different clusters come from different underlying classes, whereas those in the same cluster come from the same class. These classes represent different random vectors. Each random vector is modeled as its mean plus independent noise, sample points are generated, the points are clustered, and the clustering error is the number of points clustered incorrectly according to the generating random vectors. Clustering algorithms are evaluated based on class variance and performance improvement with respect to increasing numbers of experimental replications. The study is presented on a website, which includes error tables and graphs, confusion matrices, principle-component plots, and validation measures. There, the toolbox is applied to gene- expression clustering based on cDNA microarrays using real data.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward R. Dougherty, Junior Barrera, Marcel Brun, Seungchan Kim, Roberto M. Cesar, Yidong Chen, Michael L. Bittner, and Jeffrey M. Trent "Time series inference from clustering", Proc. SPIE 4266, Microarrays: Optical Technologies and Informatics, (4 June 2001); https://doi.org/10.1117/12.427991
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Data modeling

Visualization

Statistical analysis

Error analysis

Fuzzy logic

Genetic algorithms

Statistical modeling

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