Imaging spectrometer for fugitive gas leak detection

Michele Hinnrichs

doi:10.1117/12.372849

21 December 1999 Imaging spectrometer for fugitive gas leak detection

Michele Hinnrichs

Proceedings Volume 3853, Environmental Monitoring and Remediation Technologies II; (1999) https://doi.org/10.1117/12.372849
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

Under contract to the U.S. Air Force and Navy, Pacific Advanced Technology has developed a very sensitive infrared imaging spectrometer that can perform remote imaging and spectro-radiometry. One of the most exciting applications for this technology is in the remote monitoring of smoke stack emissions and fugitive leaks. To date remote continuous emission monitoring (CEM) systems have not been approved by the EPA, however, they are under consideration. If the remote sensing technology is available with the sensitivity to monitor emission at the required levels and man portable it can reduce the cost and improve the reliability of performing such measurements. Pacific Advanced Technology (PAT) believes that it currently has this technology available to industry. This paper will present results from a field test where gas vapors during a refueling process were imaged and identified. In addition images of propane from a leaking stove will be presented. We at PAT have developed a real time image processing board that enhances the signal to noise ratio of low contrast gases and makes them easily viewable using the Image Multispectral Sensing (IMSS) imaging spectrometer. The IMSS imaging spectrometer is the size of a camcorder. Currently the data is stored in a Notebook computer thus allowing the system to be easily carried into power plants to look for fugitive leaks. In the future the IMSS will have an embedded processor and DSP and will be able to transfer data over an Ethernet link.

Citation Download Citation

Michele Hinnrichs "Imaging spectrometer for fugitive gas leak detection", Proc. SPIE 3853, Environmental Monitoring and Remediation Technologies II, (21 December 1999); https://doi.org/10.1117/12.372849

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