Development of a vision system for cast mould defect inspection under extreme high temperatures

Weili Wang; Mengjun Liu

doi:10.1117/12.3021955

15 February 2024 Development of a vision system for cast mould defect inspection under extreme high temperatures

Weili Wang, Mengjun Liu

Proceedings Volume 13069, International Conference on Optical and Photonic Engineering (icOPEN 2023); 1306911 (2024) https://doi.org/10.1117/12.3021955
Event: International Conference on Optical and Photonic Engineering (icOPEN 2023), 2023, Singapore, Singapore

Abstract

Internal surface condition of mould will affect the metalworking product quality after the casting process. Traditional visual inspection devices cannot keep working when the temperature is beyond 70°C. A vision inspection system protected by a cooling housing was introduced in this paper. The system was designed to provide quality images for defect inspection needs while enduring high temperatures. Illumination strategy consisting of lighting position and orientation was developed to cover 360° inner surface and accentuate defects in images. The housing protected vision system would be motorized into the mould to user-specified position and capture images with trigger mode. Developed algorithm would process images and output inspection results in the backend. Overall inspection of 2-meter mould could be completed within 100 seconds. The developed vision system is fast and low-cost, which can be easily implemented on site and provide defect inspection for cast mould with high temperature.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Weili Wang and Mengjun Liu "Development of a vision system for cast mould defect inspection under extreme high temperatures", Proc. SPIE 13069, International Conference on Optical and Photonic Engineering (icOPEN 2023), 1306911 (15 February 2024); https://doi.org/10.1117/12.3021955

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KEYWORDS

Cameras

Light sources and illumination

Inspection

Defect inspection

Imaging systems

Vacuum chambers

Defect detection

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