Preprocessing to improve the accuracy of recognition of radioelement components in automated assembly devices

Evengii Semenishchev; Aleksandr Zelensky; Marina Zdanova; Yuriy Ilukhin; Viacheslav Voronin; Roman Sizyakin

doi:10.1117/12.2646164

19 December 2022 Preprocessing to improve the accuracy of recognition of radioelement components in automated assembly devices

Evengii Semenishchev, Aleksandr Zelensky, Marina Zdanova, Yuriy Ilukhin, Viacheslav Voronin, Roman Sizyakin

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Proceedings Volume 12319, Optical Metrology and Inspection for Industrial Applications IX; 123191Z (2022) https://doi.org/10.1117/12.2646164
Event: SPIE/COS Photonics Asia, 2022, Online Only

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Abstract

The article presumes a data processing algorithm that improves the accuracy of recognition of radio-electronic components in devices for automated installation. The paper proposes the use of a multicriteria filtering method that allows you to automatically change the smoothing coefficient. Varying the coefficient allows both reducing the noise component and preserving the boundaries of the radio elements without blurring. In order to enhance the contours of objects, a data simplification method is applied using the technique of reducing the range of clusters of color gradient histograms while preserving the shapes of objects. At the stage of detecting the boundaries of the elements and forming the structure of the elements of the radio component base, a modified one-dimensional two-criteria method is used. The combined analytical approach allows detection of the boundaries of radioelements and increases the productivity of the process. As test data used to evaluate the effectiveness, pairs of test images obtained by sensors fixed at various magnifications with a resolution of 1024x768 (8 bit, color image, visible range) are used. Images of simple shapes are used as analyzed objects

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Evengii Semenishchev, Aleksandr Zelensky, Marina Zdanova, Yuriy Ilukhin, Viacheslav Voronin, and Roman Sizyakin "Preprocessing to improve the accuracy of recognition of radioelement components in automated assembly devices", Proc. SPIE 12319, Optical Metrology and Inspection for Industrial Applications IX, 123191Z (19 December 2022); https://doi.org/10.1117/12.2646164

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