Paper
6 May 2019 Enhanced deep feature representation for patent image classification
Author Affiliations +
Proceedings Volume 11069, Tenth International Conference on Graphics and Image Processing (ICGIP 2018); 110690P (2019) https://doi.org/10.1117/12.2524360
Event: Tenth International Conference on Graphic and Image Processing (ICGIP 2018), 2018, Chengdu, China
Abstract
Automatic classification of digital patent images is significant for improving the efficiency of patent examination and management. In this paper, we propose a new patent image classification method based on an enhanced deep feature representation. Convolutional neural networks (CNN) is novelly applied to the patent image classification. The synergy between deep learning and traditional handcraft feature is explored. Specifically, the deep feature is first learned from massive patent image samples by AlexNet. Then such deep learning feature is further enhanced by fusing with two kinds of typical handcraft features including local binary pattern (LBP) and adaptive hierarchical density histogram (AHDH). In order to obtain a more compact feature representation, dimension of the fused feature is subsequently reduced by PCA. Finally, the patent image classification is conducted by a series of SVM classifier. Statistical test results on a large-scale image set show that the state-of-the-art performance is achieved by our proposed patent image classification method.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gege Song, Xianglin Huang, Gang Cao, Wei Liu, Jianglong Zhang, and Lifang Yang "Enhanced deep feature representation for patent image classification", Proc. SPIE 11069, Tenth International Conference on Graphics and Image Processing (ICGIP 2018), 110690P (6 May 2019); https://doi.org/10.1117/12.2524360
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Cited by 4 scholarly publications.
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KEYWORDS
Patents

Image classification

Image fusion

Binary data

Feature extraction

Image enhancement

Principal component analysis

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