MACHINE VISION

Defect detection from scratched 2 in. quadruplex video tape

[+] Author Affiliations
Neal R. Harvey

Los Alamos National Laboratory, Space and Remote Sensing Sciences Group, Los Alamos, New Mexico?87545

Stephen Marshall

University of Strathclyde, Department of Electronic and Electrical Engineering, Glasgow, G1?1XW, United Kingdom

J. Electron. Imaging. 9(2), 203-216 (Apr 01, 2000). doi:10.1117/1.482740
History: Received Mar. 23, 1999; Revised Feb. 21, 2000; Accepted Mar. 10, 2000
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Abstract

A technique is described for the detection of defects in digital video images, caused by scratching to the original 2 in. quadruplex video tape. This technique relies upon the reorientation of the digital video data into a manner similar to that in which the original analogue data would have been found on the video tape. This brings the scratched data into alignment and makes the task of detecting the scratched positions a great deal easier. In addition to enabling the detection of scratches in the video data, the technique enables new insight into the mechanisms through which the scratching was first brought about. © 2000 SPIE and IS&T.

© 2000 SPIE and IS&T

Citation

Neal R. Harvey and Stephen Marshall
"Defect detection from scratched 2 in. quadruplex video tape", J. Electron. Imaging. 9(2), 203-216 (Apr 01, 2000). ; http://dx.doi.org/10.1117/1.482740


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