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DFPS: a fast pattern selector for depth modeling mode 1 in three-dimensional high-efficiency video coding standard

[+] Author Affiliations
Gustavo Sanchez

Pontifícia Universidade Católica do Rio Grande do Sul, PPGCC, Avenida Ipiranga n. 6681, Porto Alegre CEP 90619-900, Brazil

Instituto Federal Farroupilha, RS-377, Alegrete CEP 97555-000, Brazil

Lucas Jordani, César Marcon

Pontifícia Universidade Católica do Rio Grande do Sul, PPGCC, Avenida Ipiranga n. 6681, Porto Alegre CEP 90619-900, Brazil

Luciano Agostini

Universidade Federal de Pelotas, PPGC–GACI, Rua Gomes Carneiro n. 1, Pelotas CEP 96160-000, Brazil

J. Electron. Imaging. 25(6), 063011 (Nov 30, 2016). doi:10.1117/1.JEI.25.6.063011
History: Received August 9, 2016; Accepted November 7, 2016
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Abstract.  Depth modeling mode 1 (DMM-1) processes its prediction unit (PU) without taking into account its neighborhood. However, an extensive analysis of neighbor pattern selection showed that the processing PU could use the same pattern of its neighbors or an adaptation of these patterns. Therefore, this work proposes the DMM-1 fast pattern selector (DFPS) algorithm that includes lightweight and medium-weight DMM-1 pattern predictors. DFPS starts using the lightweight predictor, whose output is compared with a threshold and then the algorithm employs a DMM-1 refinement or the medium-weight predictor. The result of this last predictor is compared against a new threshold, where the encoder decides if the remaining patterns of the DMM-1 algorithm or only its refinement should be evaluated. Experiments evaluating DFPS encoding efficiency in the all-intra mode demonstrate that by reducing 71% and 84% of the DMM-1 patterns’ evaluation, the complexity is reduced 11.7% and 13.4%, respectively, without significantly affecting the quality of the synthesized views.

© 2016 SPIE and IS&T

Citation

Gustavo Sanchez ; Lucas Jordani ; César Marcon and Luciano Agostini
"DFPS: a fast pattern selector for depth modeling mode 1 in three-dimensional high-efficiency video coding standard", J. Electron. Imaging. 25(6), 063011 (Nov 30, 2016). ; http://dx.doi.org/10.1117/1.JEI.25.6.063011


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