Regular Articles

Automatic barcode recognition method based on adaptive edge detection and a mapping model

[+] Author Affiliations
Hua Yang, Lianzheng Chen, Yifan Chen, Yong Lee, Zhouping Yin

Huazhong University of Science and Technology, School of Mechanical Science and Engineering, 1037 Luoyu Road, Wuhan 430074, China

J. Electron. Imaging. 25(5), 053019 (Sep 29, 2016). doi:10.1117/1.JEI.25.5.053019
History: Received April 1, 2016; Accepted September 9, 2016
Text Size: A A A

Abstract.  An adaptive edge detection and mapping (AEDM) algorithm to address the challenging one-dimensional barcode recognition task with the existence of both image degradation and barcode shape deformation is presented. AEDM is an edge detection-based method that has three consecutive phases. The first phase extracts the scan lines from a cropped image. The second phase involves detecting the edge points in a scan line. The edge positions are assumed to be the intersecting points between a scan line and a corresponding well-designed reference line. The third phase involves adjusting the preliminary edge positions to more reasonable positions by employing prior information of the coding rules. Thus, a universal edge mapping model is established to obtain the coding positions of each edge in this phase, followed by a decoding procedure. The Levenberg–Marquardt method is utilized to solve this nonlinear model. The computational complexity and convergence analysis of AEDM are also provided. Several experiments were implemented to evaluate the performance of AEDM algorithm. The results indicate that the efficient AEDM algorithm outperforms state-of-the-art methods and adequately addresses multiple issues, such as out-of-focus blur, nonlinear distortion, noise, nonlinear optical illumination, and situations that involve the combinations of these issues.

© 2016 SPIE and IS&T

Citation

Hua Yang ; Lianzheng Chen ; Yifan Chen ; Yong Lee and Zhouping Yin
"Automatic barcode recognition method based on adaptive edge detection and a mapping model", J. Electron. Imaging. 25(5), 053019 (Sep 29, 2016). ; http://dx.doi.org/10.1117/1.JEI.25.5.053019


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.