Special Section on Quality Control by Artificial Vision: Nonconventional Imaging Systems

Calibration and disparity maps for a depth camera based on a four-lens device

[+] Author Affiliations
Cécile Riou, Bruno Colicchio, Jean Philippe Lauffenburger, Olivier Haeberlé, Christophe Cudel

Université de Haute Alsace, Laboratoire MIPS (EA2332), 61 rue Albert Camus, Mulhouse 68093, France

J. Electron. Imaging. 24(6), 061108 (Dec 22, 2015). doi:10.1117/1.JEI.24.6.061108
History: Received June 25, 2015; Accepted November 13, 2015
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Abstract.  We propose a model of depth camera based on a four-lens device. This device is used for validating alternate approaches for calibrating multiview cameras and also for computing disparity or depth images. The calibration method arises from previous works, where principles of variable homography were extended for three-dimensional (3-D) measurement. Here, calibration is performed between two contiguous views obtained on the same image sensor. This approach leads us to propose a new approach for simplifying calibration by using the properties of the variable homography. Here, the second part addresses new principles for obtaining disparity images without any matching. A fast algorithm using a contour propagation algorithm is proposed without requiring structured or random pattern projection. These principles are proposed in a framework of quality control by vision, for inspection in natural illumination. By preserving scene photometry, some other standard controls, as for example calipers, shape recognition, or barcode reading, can be done conjointly with 3-D measurements. Approaches presented here are evaluated. First, we show that rapid calibration is relevant for devices mounted with multiple lenses. Second, synthetic and real experimentations validate our method for computing depth images.

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Citation

Cécile Riou ; Bruno Colicchio ; Jean Philippe Lauffenburger ; Olivier Haeberlé and Christophe Cudel
"Calibration and disparity maps for a depth camera based on a four-lens device", J. Electron. Imaging. 24(6), 061108 (Dec 22, 2015). ; http://dx.doi.org/10.1117/1.JEI.24.6.061108


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