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Qualified matching feature collection for feature point-based copy-move forgery detection

[+] Author Affiliations
Liyang Yu

Harbin Institute of Technology, School of Computer Science and Technology, No. 92 West Dazhi Street, Harbin 150010, China

Mudanjiang Normal University, Department of Computer Science and Technology, No. 191 Wenhua Street, Mudanjiang 157012, China

Qi Han, Xiamu Niu

Harbin Institute of Technology, School of Computer Science and Technology, No. 92 West Dazhi Street, Harbin 150010, China

J. Electron. Imaging. 24(2), 023035 (Apr 23, 2015). doi:10.1117/1.JEI.24.2.023035
History: Received August 13, 2014; Accepted March 31, 2015
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Abstract.  The feature matching step plays a critical role during the copy-move forgery detection procedure. However, when several highly similar features simultaneously exist in the feature space, current feature matching methods will miss a considerable number of genuine matching feature pairs. To this end, we propose a clustering-based method to collect qualified matching features for the feature point-based methods. The proposed method can collect far more genuine matching features than existing methods do, and thus significantly improve the detection performance, especially for multiple pasting cases. Experimental results confirm the efficacy of the proposed method.

© 2015 SPIE and IS&T

Citation

Liyang Yu ; Qi Han and Xiamu Niu
"Qualified matching feature collection for feature point-based copy-move forgery detection", J. Electron. Imaging. 24(2), 023035 (Apr 23, 2015). ; http://dx.doi.org/10.1117/1.JEI.24.2.023035


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