Special Section on Compressive Sensing for Imaging

Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology

[+] Author Affiliations
Anna Brook

Royal Military Academy, Department of Communication, Information, Systems and Sensors, Brussels, Belgium

Edison Cristofani

Royal Military Academy, Department of Communication, Information, Systems and Sensors, Brussels, Belgium

Mathias Becquaert

Royal Military Academy, Department of Communication, Information, Systems and Sensors, Brussels, Belgium

Ben Lauwens

Royal Military Academy, Department of Mathematics, Brussels, Belgium

Joachim Jonuscheit

Fraunhofer Institute for Physical Measurements Techniques, Kaiserslautern, Germany

Marijke Vandewal

Royal Military Academy, Department of Communication, Information, Systems and Sensors, Brussels, Belgium

J. Electron. Imaging. 22(2), 021004 (Jan 31, 2013). doi:10.1117/1.JEI.22.2.021004
History: Received August 16, 2012; Revised December 6, 2012; Accepted December 17, 2012
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Abstract.  The quality control of composite multilayered materials and structures using nondestructive tests is of high interest for numerous applications in the aerospace and aeronautics industry. One of the established nondestructive methods uses microwaves to reveal defects inside a three-dimensional (3-D) object. Recently, there has been a tendency to extrapolate this method to higher frequencies (going to the subterahertz spectrum) which could lead to higher resolutions in the obtained 3-D images. Working at higher frequencies reveals challenges to deal with the increased data rate and to efficiently and effectively process and evaluate the obtained 3-D imagery for defect detection and recognition. To deal with these two challenges, we combine compressive sensing (for data rate reduction) with a dedicated image processing methodology for a fast, accurate, and robust quality evaluation of the object under test. We describe in detail the used methodology and evaluate the obtained results using subterahertz data acquired of two calibration samples with a frequency modulated continuous wave system. The applicability of compressive sensing within this context is discussed as well as the quality of the image processing methodology dealing with the reconstructed images.

© 2013 SPIE and IS&T

Citation

Anna Brook ; Edison Cristofani ; Mathias Becquaert ; Ben Lauwens ; Joachim Jonuscheit, et al.
"Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology", J. Electron. Imaging. 22(2), 021004 (Jan 31, 2013). ; http://dx.doi.org/10.1117/1.JEI.22.2.021004


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