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Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm

[+] Author Affiliations
Janghee Lee

Seoul National University, School of Computer Science and Engineering, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul, 151-742 Korea

Suk I. Yoo

Seoul National University, School of Computer Science and Engineering, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul, 151-742 Korea

J. Electron. Imaging. 21(3), 033014 (Sep 14, 2012). doi:10.1117/1.JEI.21.3.033014
History: Received May 31, 2011; Revised May 26, 2012; Accepted July 17, 2012
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Abstract.  We present a new formulation to solve a defect detection problem on images using multiple reference images. The reference images are defect-free images obtained from the same position of other products. The defect detection problem is reformulated as a binary labeling problem, where each pixel is labeled with “one” if it contains a defect and with “zero” otherwise. The formulation of the energy function used for the labeling problem is defined. Then, the graph-cuts algorithm is used to obtain the optimal label set minimizing the energy function that becomes the defect detection result. The presented approaches are robust to noises taken from several sources, including image-taking, transmission process, environmental lighting, and pattern variation. It does not suffer from the alignment problem for the conventional comparison methods using references. These approaches are illustrated with real data sets, semiconductor wafer images collected by scanning electron microscope equipment, and compared to other defect detection approach.

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© 2012 SPIE and IS&T

Citation

Janghee Lee and Suk I. Yoo
"Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm", J. Electron. Imaging. 21(3), 033014 (Sep 14, 2012). ; http://dx.doi.org/10.1117/1.JEI.21.3.033014


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