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Residual bulk image quantification and management for a full frame charge coupled device image sensor

[+] Author Affiliations
Richard Crisp

Invensas, Inc., 3025 Orchard Parkway, San Jose, California 95134

J. Electron. Imaging. 20(3), 033006 (August 16, 2011). doi:10.1117/1.3604004
History: Received June 24, 2008; Revised May 25, 2011; Accepted June 06, 2011; Published August 16, 2011; Online August 16, 2011
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Residual bulk image (RBI) is significant in the KAF09000 CCD. Residual images are observed 2 h after illumination at −20C. Trap leakage and capacity are studied as a function of temperature. A flood-flush protocol is evaluated for eliminating RBI artifacts. A substrate trap fixed pattern noise is observed and is removed by dark-subtraction. An increase of dark current shot noise due to trap leakage will occur but can be minimized by deep cooling. Operating temperature targets are set as a function of target noise levels. An operating temperature of –87C for a 30 min exposure is projected to support a read noise constraint of 5 e-.

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Citation

Richard Crisp
"Residual bulk image quantification and management for a full frame charge coupled device image sensor", J. Electron. Imaging. 20(3), 033006 (August 16, 2011). ; http://dx.doi.org/10.1117/1.3604004


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